Využití pro LEXT OLS4000

Certified accuracy and repeatability
High resolution (down to 120nm L&S)
Outstanding slope detection capability
    (up to 85°)
Fast and easy operation environment
Roughness testing according to all 
    standards
Advanced dual pinhole technology for 
    superior flexibility 
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Hlavní funkceTechnické údajeRozměryVyužití

Bare wafer manufacturers
• Measurement of laser mark depth
• Analysis of roughness of wafer surface in polishing
   process
• Inspection of extraneous substances
• Measurement of taper at wafer edge
• Observation of cracks at wafer edge

 

 

Chemical materials
• Measurement of height differences of the optical
   waveguides on flat panel displays
• Measurement of film thickness on the deflecting
   plate for flat panal display
• Analysis of adhesive roughness
• Roughness of coating surface
• Shape of toner surface
• Analysis of metal materials after chemical treatment

 

 

Metal materials
•Analysis of corroded part
•Analysis of fracture plane
•Analysis of coating surface
•Measurement of depth of Vickers mark
•Thickness measurement of protective coatings

 

 

Automotive parts
•Surface analysis of brake pads and discs
•Analysis of sliding surface on clutch parts
•Analysis of fracture plane in piston rings.
•Surface profile of studless tires
•Surface profile of oil seal molds
•Surface profile of fuel injector
•Analysis of wear of ball bearings for steering
•Cooling fan, compressor, muffler, calibrator, etc.
•Wire and carbon materials

 

Other applications
•Control of SAW filter line width
•Control of LD/LED line width
•Inspection of condenser surface profile
•CD/DVD pit shape
•Surface profile of magnetic tape
•Inspection of surface profile of fiber
•Observation of ceramic particles
•Groove on pull-tab of aluminum can

  Unique applications
•Hair
•Lipstick
•Foundation
•Teeth (artificial teeth)
•Plants
•Pearls
•Excavated historical relics
•Golf clubs and balls
•Markings on drugs

 





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LEXT OLS4000
  Katalogy
Schémata zapojení
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